WEB OF SCIENCE
SCOPUS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Pangi | - |
| dc.contributor.author | Lee, Junghyup | - |
| dc.contributor.author | Cho, Seonghwan | - |
| dc.date.accessioned | 2024-12-18T11:40:16Z | - |
| dc.date.available | 2024-12-18T11:40:16Z | - |
| dc.date.created | 2024-09-25 | - |
| dc.date.issued | 2024-12 | - |
| dc.identifier.issn | 0018-9200 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/57293 | - |
| dc.description.abstract | This article presents a sub-ranging current reference with a low-temperature coefficient (TC) across a wide temperature range. By using a TC-adjustable current source and a process-insensitive sub-range detector, the impact of second-order TC can be reduced by nearly fourfold, without any discontinuities at the subrange boundaries. Implemented in a 0.18-μ m CMOS process, the proposed current reference achieves an average TC of 11.4-ppm/°C across from -20 °C to 125 °C, obtained from 45 samples across five process corners without chip-by-chip calibration. The proposed current source exhibits low line and load sensitivities of 365 and 181 ppm/V, respectively, and an integrated noise of 38.9 pArms within a 10-Hz bandwidth. © 2024 IEEE. | - |
| dc.language | English | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | A PVT-Insensitive Sub-Ranging Current Reference Achieving 11.4-ppm° C From-20° C to 125 ° C | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1109/JSSC.2024.3450950 | - |
| dc.identifier.wosid | 001308154100001 | - |
| dc.identifier.scopusid | 2-s2.0-85210765679 | - |
| dc.identifier.bibliographicCitation | IEEE Journal of Solid-State Circuits, v.59, no.12, pp.4057 - 4067 | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.subject.keywordAuthor | Current reference | - |
| dc.subject.keywordAuthor | process-voltage-temperature (PVT) invariance | - |
| dc.subject.keywordAuthor | sub-range detector | - |
| dc.subject.keywordAuthor | sub-ranging | - |
| dc.subject.keywordAuthor | temperature coefficient (TC) | - |
| dc.subject.keywordAuthor | TC-adjustable current source | - |
| dc.subject.keywordPlus | INSTRUMENTATION AMPLIFIER | - |
| dc.subject.keywordPlus | 3-SIGMA INACCURACY | - |
| dc.subject.keywordPlus | REFERENCE CIRCUIT | - |
| dc.subject.keywordPlus | COMPENSATION | - |
| dc.subject.keywordPlus | SUPPRESSION | - |
| dc.subject.keywordPlus | FEEDBACK | - |
| dc.subject.keywordPlus | DESIGN | - |
| dc.subject.keywordPlus | SENSOR | - |
| dc.subject.keywordPlus | CMOS BANDGAP REFERENCE | - |
| dc.subject.keywordPlus | NOISE | - |
| dc.citation.endPage | 4067 | - |
| dc.citation.number | 12 | - |
| dc.citation.startPage | 4057 | - |
| dc.citation.title | IEEE Journal of Solid-State Circuits | - |
| dc.citation.volume | 59 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.type.docType | Article | - |
Department of Electrical Engineering and Computer Science