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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 장일류 | - |
| dc.contributor.author | 김회준 | - |
| dc.date.accessioned | 2025-07-24T18:40:13Z | - |
| dc.date.available | 2025-07-24T18:40:13Z | - |
| dc.identifier.uri | https://scholar.dgist.ac.kr/handle/20.500.11750/58708 | - |
| dc.description.abstract | A particle measuring device, according to the present invention, comprises: a measurement unit comprising first and second electrodes which are patterned on a base formed of a piezoelectric material so as to mutually transmit and receive signals, wherein the measurement unit measures the mass of particles by means of a change in the signals transmitted and received between the first and second electrodes; and an adsorption unit which is provided in an adsorption region provided between the first and second electrodes so as to adsorb fine particles according to a temperature change. According to the present invention, the device has a high adsorption rate and does not interfere with the resonance rate of the piezoelectric material, thereby having excellent particle measurement quality. | - |
| dc.title | PARTICLE MEASURING DEVICE, AND METHOD FOR MANUFACTURING SAME | - |
| dc.title.alternative | PARTICLE MEASURING APPARATUS AND MANUFACTURING METHOD THEREOF | - |
| dc.type | Patent | - |
| dc.identifier.bibliographicCitation | 장일류. PARTICLE MEASURING DEVICE, AND METHOD FOR MANUFACTURING SAME. | - |
| dc.publisher.country | UN | - |
| dc.identifier.patentApplicationNumber | PCT/KR2022/006221 | - |
| dc.date.application | 2022-05-02 | - |
| dc.identifier.patentRegistrationNumber | 2022265220 | - |
| dc.date.registration | 2022-12-22 | - |
| dc.contributor.assignee | DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY,재단법인대구경북과학기술원 | - |
| dc.type.iprs | 특허 | - |
