STED MICROSCOPE IMAGE PROCESSING METHOD AND STED MICROSCOPE SYSTEM

Abstract

The present invention provides a STED microscope image processing method and a STED microscope system, the method comprising the steps of: obtaining a first STED image by using a first main image, which is obtained by emitting an excitation laser beam and a first STED laser beam at an object being measured, and a first auxiliary image, which is obtained by emitting only the first STED laser beam at the object being measured; obtaining a second STED image by using a second main image, which is obtained by emitting, at the object being measured, the excitation laser beam and a second STED laser beam of an intensity different from that of the first STED laser beam, and a second auxiliary image, which is obtained by emitting only the second STED laser beam at the object being measured; and using the first STED image and the second STED image so as to obtain a final image from which background noise is removed.