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Flattening Energy Puddles for Enhanced Charge Transport in Wrinkled WSe2
- Park, Dae Young ;
- Kim, Taehoon ;
- Kim, Bora ;
- Park, Nohyoon ;
- Bang, Seungho ;
- Lee, Dohyeon ;
- Choi, Deogkyu ;
- Kim, Dong Hyeon ;
- Yoo, Jaekak ;
- Lee, Seung Mi ;
- Yu, Young Joo ;
- Jo, Jieun ;
- Song, Jungeun ;
- Ko, Hayoung ;
- Won, Yo Seob ;
- Jeong, Takmo ;
- Yun, Seok Joon ;
- Kim, Ki Kang ;
- Kim, Dong-Wook ;
- Sung, Jooyoung ;
- Jeong, Mun Seok
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- Title
- Flattening Energy Puddles for Enhanced Charge Transport in Wrinkled WSe2
- Issued Date
- ACCEPT
- Citation
- SMALL
- Type
- Article
- Author Keywords
- charge carrier dynamics ; femtosecond transient absorption microscopy ; monolayer WSe2 ; trioctylphosphine selenide ; wrinkle defect passivation
- Keywords
- EXCITON FORMATION ; MONOLAYER ; TRANSITION ; LAYER
- ISSN
- 1613-6810
- Abstract
-
Wrinkles, a prevalent form of line defect in monolayer (1L) 2D materials, significantly degrade their optoelectronic performance by inducing local strain, energy puddles, and charge trapping. This study introduces a wrinkle-selective strategy utilizing trioctylphosphine selenide (TOPSe), which exploits its steric hindrance and electron-donating nature to selectively heal selenium vacancies at strained wrinkle sites in 1L-WSe2. Comprehensive spectroscopic characterization-comprising Raman spectroscopy, photoluminescence spectroscopy, and femtosecond transient absorption microscopy-demonstrated substantial reductions in the defect density, suppressed non-radiative recombination, and prolonged exciton lifetimes. Kelvin probe force microscopy further revealed wrinkle-specific electron doping and spatial homogenization of the conduction band. Field-effect transistors based on TOPSe-treated 1L-WSe2 exhibited more than a two-fold increase in current and mobility, in conjunction with a transition from p-type to n-type conduction. Our findings indicate that wrinkle-targeted molecular engineering is a versatile approach for addressing intrinsic inhomogeneities in 2D materials and enabling high-performance optoelectronic devices.
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- Publisher
- WILEY-V C H VERLAG GMBH
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