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A 114-aFrms-Resolution 46-NF/10-MΩ-Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing

Title
A 114-aFrms-Resolution 46-NF/10-MΩ-Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing
Authors
George, Arup KocheethraShim, WooyoonJe, M.Lee, Junghyup
DGIST Authors
Lee, Junghyup
Issue Date
2018-06-20
Citation
32nd IEEE Symposium on VLSI Circuits, VLSI Circuits 2018, 157-158
Type
Conference
Abstract
This paper presents a digital-intensive dynamically reconfigurable RC-to-digital converter with an input range of 46 nF/10 MΩ, suitable for reading out R or C sensors in a time-interleaved way. Its reconfigurability also allows parasitic-insensitive sensing of femto-farad baseline capacitances. Implemented in a 0.18-μm CMOS process, it uses a swing-boosted period-modulation (SB-PM) frontend, achieving a capacitance resolution of 114 aFrms corresponding to an FOM of 4.04 pJ/conversion-step from a 1-V supply. © 2018 IEEE.
URI
http://hdl.handle.net/20.500.11750/9499
DOI
10.1109/VLSIC.2018.8502332
Publisher
Institute of Electrical and Electronics Engineers Inc.
Related Researcher
  • Author Lee, Junghyup Integrated Nano-Systems Lab
  • Research Interests Analog and Mixed Signal IC Design; Smart Sensor Systems; Bio-medical ICs and Body Channel Communication Systems
Files:
There are no files associated with this item.
Collection:
Department of Information and Communication EngineeringIntegrated Nano-Systems Lab2. Conference Papers


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