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Showing results 4 to 7 of 7

Issue Date	Title Author(s) Journal	View
2015-09	Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode Kim, Joonwoo ; Myung, Sung ; Noh, Hee-Yeon ; Jeong, Soon Moon ; Jeong, Jaewook AIP Advances, v.5, no.9, 2015-09	656
2010-11	High performance and the low voltage operating InGaZnO thin film transistor Son, Dae-ho ; Kim, Dae-Hwan ; Sung, Shi-Joon ; Jung, Eun-Ae ; Kang, Jin-Kyu Current Applied Physics, v.10, no.4, pp.E157 - E160, 2010-11	635
2015-11	Scaling characteristics of depletion type, fully transparent amorphous indium-gallium-zinc-oxide thin-film transistors and inverters following Ar plasma treatment Kim, Joonwoo ; Jeong, Soon Moon ; Jeong, Jaewook Japanese Journal of Applied Physics, v.54, no.11, 2015-11	684
2007-01	Transparent amorphous indium zinc oxide thin-film transistors fabricated at room temperature Song, Ju-Il ; Park, Jae-Soung ; Kim, Howoon ; Heo, Young-Woo ; Lee, Joon-Hyung ; Kim, Jeong-Joo ; Kim, G. M. ; Choi, Byeongdae American Institute of Physics, 2007-01	532

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