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Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

Article
Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis
  • 2018-09
  • Lee, Myoung-Jae. (2018-09). Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis. ACS Applied Materials & Interfaces, 10(35), 29757–29765. doi: 10.1021/acsami.8b09046
  • American Chemical Society
  • View : 1197
  • Download : 92
Article
Spontaneous pseudo-topological silicon quantization for redesigned Si-based Li-ion batteries
  • Ogata, Ken ; 
  • Ko, Dong-Su ; 
  • Jung, Changhoon ; 
  • Lee, Jun-Ho ; 
  • Sul, Soohwan ; 
  • Kim, Hee-Goo ; 
  • Seo, Jinah ; 
  • Jang, Jihyun ; 
  • Koh, Meiten ; 
  • Kim, Kihong ; 
    • et al
  • 2019-02
  • Ogata, Ken. (2019-02). Spontaneous pseudo-topological silicon quantization for redesigned Si-based Li-ion batteries. doi: 10.1016/j.nanoen.2018.11.092
  • Elsevier BV
  • View : 892
  • Download : 0
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