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Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode

Article
Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode
  • 2018-08
  • Song, Min Ho. (2018-08). Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode. doi: 10.1109/JEDS.2018.2864180
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 929
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Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

Article
Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis
  • 2018-09
  • Lee, Myoung-Jae. (2018-09). Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis. ACS Applied Materials & Interfaces, 10(35), 29757–29765. doi: 10.1021/acsami.8b09046
  • American Chemical Society
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  • Download : 37
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