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  • 2020-06
  • Lee, Hyeon-Jun. (2020-06). A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits. IEEE Electron Device Letters, 41(6), 896–899. doi: 10.1109/led.2020.2986478
  • Institute of Electrical and Electronics Engineers
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Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States

  • 2018-12
  • Lee, Hyeon-Jun. (2018-12). Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States. IEEE Journal of the Electron Devices Society, 6(1), 830–834. doi: 10.1109/JEDS.2018.2855731
  • Institute of Electrical and Electronics Engineers Inc.
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