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A Novel Mitigation Method for Noise-Induced Temperature Error in CPU Thermal Control

  • 2020-05
  • Lee, Juseung. (2020-05). A Novel Mitigation Method for Noise-Induced Temperature Error in CPU Thermal Control. IEEE Access, 8, 94000–94009. doi: 10.1109/ACCESS.2020.2995184
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 802
  • Download : 176
  • 2024-07
  • Song, Minyoung. (2024-07). An Energy Efficient and Temperature Stable Digital FLL-Based Wakeup Timer With Time-Domain Temperature Compensation. IEEE Transactions on Circuits and Systems II: Express Briefs, 71(7), 3298–3302. doi: 10.1109/TCSII.2024.3365211
  • IEEE
  • View : 122
  • Download : 0
  • 2022-07
  • Eom, Yunji. (2022-07). Development of a Temperature Sensor Using Spin-Crossover Fe(pyrazine)[Pt(CN)(4)I] Nanoparticles. IEEE Magnetics Letters, 13. doi: 10.1109/LMAG.2022.3189274
  • Institute of Electrical and Electronics Engineers
  • View : 457
  • Download : 0

Low-temperature behaviors of multilayer MoS2 transistors with ohmic and Schottky contacts

  • Choi, Woong
  • Yin, Demin
  • Choo, Sooho
  • Jeong, Seok-Hwan
  • Kwon, Hyuk-Jun
  • Yoon, Youngki
  • Kim, Sunkook
  • 2019-07
  • Choi, Woong. (2019-07). Low-temperature behaviors of multilayer MoS2 transistors with ohmic and Schottky contacts. Applied Physics Letters, 115(3). doi: 10.1063/1.5099380
  • American Institute of Physics
  • View : 579
  • Download : 30
  • Jeon, Taehyeong
  • Lee, Jaehoon
  • Talantsev, Artem
  • Kim, CheolGi
  • 2019-09
  • Jeon, Taehyeong. (2019-09). Planar Hall Resistance Sensor With Improved Thermal Stability. doi: 10.1109/LMAG.2019.2943054
  • Institute of Electrical and Electronics Engineers
  • View : 622
  • Download : 0
  • 2021-10
  • Kim, Dongsu. (2021-10). PZT Ferroelectric Synapse TFT With Multi-Level of Conductance State for Neuromorphic Applications. doi: 10.1109/ACCESS.2021.3119607
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 565
  • Download : 0
  • 2021-02
  • Yoo, Woosuk. (2021-02). The Azimuthal Dependence of Exchange Bias Effect and Its Analysis by Spin Glass Model in Ni0.8Fe0.2/CoxNi1-xO Bilayers. IEEE Access, 9, 221315–21322. doi: 10.1109/ACCESS.2021.3055521
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 550
  • Download : 0
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