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Issue Date	Title Author(s) Journal	View
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	402
2018-12	Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States Lee, Hyeon-Jun ; Abe, Katsumi ; Cho, Sung Haeng ; Kim, June Seo ; Bang, Seokhwan ; Lee, Myoung Jae Institute of Electrical and Electronics Engineers Inc., 2018-12	440

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