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Issue Date	Title Author(s) Journal	View
2007-07	Sensitivity map generation in electrical capacitance tomography using mixed normalization models Kim, Yong Song ; Lee, Seonghun ; Ijaz, Umer Zeeshan ; Kim, Kyung Youn ; Choi, Bong Yeol Measurement Science and Technology, v.18, no.7, pp.2092 - 2102, 2007-07	662
2007-07	Sensitivity map generation in electrical capacitance tomography using mixed normalization models Kim, Yong Song ; Lee, Seonghun ; Ijaz, Umer Zeeshan ; Kim, Kyung Youn ; Choi, Bong Yeol Measurement Science and Technology, v.18, no.7, pp.2092 - 2102, 2007-07	72

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