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Issue Date	Title Author(s) Journal	View
2011-11-10	Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors Jeong, J. ; Kim, J. ; Lee, G. J. ; Choi, B. -D. Electronics Letters, v.47, no.23, pp.1295 - 1297, 2011-11-10	636
2011-11-10	Numerical analysis of effects of back channel interfacial states on characteristics of amorphous InGaZnO thin-film transistors Jeong, J. ; Kim, J. ; Lee, G. J. ; Choi, B. -D. Electronics Letters, v.47, no.23, pp.1295 - 1297, 2011-11-10	27

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