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Issue Date Title Author(s) Journal View
2015-11-19

Kim, J. Jeong, S. M. Jeong, J.

Electronics Letters, v.51, no.24, pp.2047 - 2048, 2015-11-19

543
2015-09

Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode

Kim, Joonwoo Myung, Sung Noh, Hee-Yeon Jeong, Soon Moon Jeong, Jaewook

AIP Advances, v.5, no.9, 2015-09

656
1

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