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Issue Date	Title Author(s) Journal	View
2017-08	Impact of transient currents caused by alternating drain stress in oxide semiconductors Lee, Hyeon-Jun ; Cho, Sung Haeng ; Abe, Katsumi ; Lee, Myoung-Jae ; Jung, Minkyung Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08	647

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