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Issue Date	Title Author(s) Journal	View
2017-12	Thickness-Dependent Phonon Renormalization and Enhanced Raman Scattering in Ultrathin Silicon Nanomembranes Lee, Seon Woo ; Kim, Kang Won ; Dhakal, Krishna P. ; Kim, Hyun Min ; Yun, Won Seok ; Lee, Jae Dong ; Cheong, Hyeon Sik ; Ahn, Jong Hyun American Chemical Society, 2017-12	685
2013	Coherant Raman Scattering Microscopy Xie Xiaoliang Sunney ; Cheng Ji-Xin CRC Press, 2013	588

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