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Issue Date	Title Author(s) Journal	View
2022-07-13	Improving compute in-memory ECC reliability with successive correction Crafton, Brian ; Wan, Zishen ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Wu, Wei ; Tokunaga,Carlos ; De, Vivek ; Raychowdhury, Arijit Design Automation Conference, pp.745 - 750, 2022-07-13	11
2021-11-09	CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation Crafton, Brian ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Wu, Wei ; Tokunaga, Carlos ; De, Vivek ; Raychowdhury, Arijit IEEE Asian Solid-State Circuits Conference, pp.1 - 3, 2021-11-09	12

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