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Issue Date Title Author(s) Journal View
2021-04-29
A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Custom Integrated Circuits Conference (CICC 2021), pp.152 - 153, 2021-04-29

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