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Issue Date Title Author(s) Journal View
2022-03
A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, v.57, no.3, pp.845 - 857, 2022-03

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