A novel method for device-related electroencephalography artifact suppression to explore cochlear implant-related cortical changes in single-sided deafness
A novel method for device-related electroencephalography artifact suppression to explore cochlear implant-related cortical changes in single-sided deafness
Issued Date
2015-11
Citation
Kim, Kyungsoo. (2015-11). A novel method for device-related electroencephalography artifact suppression to explore cochlear implant-related cortical changes in single-sided deafness. Journal of Neuroscience Methods, 255, 22–28. doi: 10.1016/j.jneumeth.2015.07.020