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Optical Properties of Cu-Doped ZnO Films Prepared by Cu Solution Coating
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Title
Optical Properties of Cu-Doped ZnO Films Prepared by Cu Solution Coating
Issued Date
2015-10
Citation
Allabergenov, Bunyod. (2015-10). Optical Properties of Cu-Doped ZnO Films Prepared by Cu Solution Coating. Journal of Nanoscience and Nanotechnology, 15(10), 7664–7670. doi: 10.1166/jnn.2015.11209
Type
Article
Author Keywords
ZnO Thin FilmsCu InkSpin Coating MethodDopingOptical Properties
Keywords
AnnealingAnnealing TemperaturesCoatingsCOPPERCu InkDEPOSITIONDopingDoping (Additives)Energy Dispersive Spectroscopies (EDS)Energy Dispersive SpectroscopyFilm PreparationGrain Size and ShapeHexagonal Wurtzite StructureMetallic FilmsMorphological AnalysisOptical FilmsOptical PropertiesPHOTOLUMINESCENCEScanning Electron MicroscopySemiconductor DopingSpectrofluorometersSpin-Coating MethodSpin Coating MethodTemperature AnnealingTHIN-FILMSThin FilmsX Ray DiffractionZinc OxideZinc SulfideZnO Thin FilmZnO THIN-FILMS
ISSN
1533-4880
Abstract
This work demonstrates the fabrication of Cu-doped ZnO films by Cu solution coating method. Cu ink was spin coated on ZnO thin films prepared by e-beam deposition. After curing and annealing at high temperatures, structural, morphological and optical properties of the films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and spectrofluorometer, respectively. The XRD results showed that ZnO films formed polycrystalline with a hexagonal wurtzite structure, and the grain size increased with increasing the annealing temperature from 500 to 850°C. The changes in lattice parameters were caused by grain size, strain, and residual stress. Morphological analysis have revealed that the Cu-doped ZnO film after annealing at 500°C has flat surface with uniformly distributed grain size, which became porous after higher temperature annealing process. Energy dispersive spectroscopy (EDS) and photoluminescence spectras have shown the presence of Zn, Cu, and O elements, and combined violet, blue, green and weak red emissions between 350 and 650 nm in the ZnO films, respectively. Copyright © 2015 American Scientific Publishers All rights reserved.
URI
http://hdl.handle.net/20.500.11750/2840
DOI
10.1166/jnn.2015.11209
Publisher
American Scientific Publishers
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Chung, Seok-Hwan정석환

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