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Issue Date	Title Author(s) Journal	View
2015-10-07	Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy Min, Won Ja ; Park, Kyungsu ; Yu, Kyu-Sang ; Joo, Sungjung ; Kim, Yong-Sung ; Moon, Dae Won Journal of Applied Physics, v.118, no.13, 2015-10-07	729
2020-04	Multiplex Protein Imaging with Secondary Ion Mass Spectrometry Using Metal Oxide Nanoparticle-Conjugated Antibodies Moon, Dae Won ; Park, Young Ho ; Lee, Sun Young ; Lim, Heejin ; Kwak, SuHwa ; Kim, Minseok S. ; Kim, Hyunmin ; Kim, Eunjoo ; Jung, Yebin ; Hoe, Hyang-Sook ; et al ACS Applied Materials & Interfaces, v.12, no.15, pp.18056 - 18064, 2020-04	743
2018-09	Quantitative Analysis of Calcium Phosphate Nanocluster Growth Using Time-of-Flight Medium-Energy-Ion-Scattering Spectroscopy Park, Jimin ; Yang, Ki Dong ; Kim, Na-Young ; Jung, Kang-Won ; Le, Viet-Duc ; Lim, Hee-Jin ; An, Junghyun ; Jin, Kyoungsuk ; Kim, Yong-Hyun ; Nam, Ki Tae ; et al American Chemical Society, 2018-09	579

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