Cited time in webofscience Cited time in scopus

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dc.contributor.author Kim, Seunghyeon -
dc.contributor.author Won, Yuchang -
dc.contributor.author Park, Kyung-Joon -
dc.contributor.author Eun, Yongsoon -
dc.date.accessioned 2023-12-26T14:40:22Z -
dc.date.available 2023-12-26T14:40:22Z -
dc.date.created 2023-11-08 -
dc.date.issued 2024-03 -
dc.identifier.issn 1551-3203 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/46731 -
dc.description.abstract Most of the existing studies on analyzing the productivity of serial production lines focus on cases where the coefficient of variation () for both uptime and downtime is less than 1. Hardly any result is available when , i.e., uptime and downtime of machines exhibit high variability. The improvement of the production lines with high variable uptime and downtime depends on heuristic trial and error due to the lack of analysis method. This article suggests a neural network that approximates the throughput of serial production lines from machine and buffer parameters. Four neural network architectures (multilayer perceptron, recurrent neural network, long short-term memory (LSTM), and gated recurrent unit) are compared to determine the most effective architecture for the throughput approximation task. Training data are obtained from discrete-event simulations, encompassing a wide range of parameters. The results indicate that the LSTM model outperforms the other architecture considered. Furthermore, we present bottleneck identification and continuous improvement scenarios utilizing the model. © 2023 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See https://www.ieee.org/publications/rights/index.html for more information. -
dc.language English -
dc.publisher Institute of Electrical and Electronics Engineers -
dc.title Throughput Approximation by Neural Network for Serial Production Lines With High Up/Downtime Variability -
dc.type Article -
dc.identifier.doi 10.1109/TII.2023.3321026 -
dc.identifier.wosid 001090744800001 -
dc.identifier.scopusid 2-s2.0-85174827448 -
dc.identifier.bibliographicCitation IEEE Transactions on Industrial Informatics, v.20, no.3, pp.4227 - 4235 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordAuthor high variability -
dc.subject.keywordAuthor Industry 4.0 -
dc.subject.keywordAuthor throughput analysis -
dc.subject.keywordAuthor Weibull distribution -
dc.subject.keywordAuthor Deep learning -
dc.subject.keywordPlus MODELS -
dc.citation.endPage 4235 -
dc.citation.number 3 -
dc.citation.startPage 4227 -
dc.citation.title IEEE Transactions on Industrial Informatics -
dc.citation.volume 20 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Automation & Control Systems; Computer Science; Engineering -
dc.relation.journalWebOfScienceCategory Automation & Control Systems; Computer Science, Interdisciplinary Applications; Engineering, Industrial -
dc.type.docType Article -

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