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Department of Electrical Engineering and Computer Science
Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab.
1. Journal Articles
Extreme heat flux cooling from functional copper inverse opal-coated manifold microchannels
Kong, Daeyoung
;
Kwon, Heungdong
;
Jang, Bongho
;
Kwon, Hyuk-Jun
;
Asheghi, Mehdi
;
Goodson, Kenneth E.
;
Lee, Hyoungsoon
Department of Electrical Engineering and Computer Science
Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab.
1. Journal Articles
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Title
Extreme heat flux cooling from functional copper inverse opal-coated manifold microchannels
Issued Date
2024-09
Citation
Kong, Daeyoung. (2024-09). Extreme heat flux cooling from functional copper inverse opal-coated manifold microchannels. Energy Conversion and Management, 315. doi: 10.1016/j.enconman.2024.118809
Type
Article
Author Keywords
Thermal management
;
Single- and two-phase cooling
;
Manifold microchannel
;
Copper inverse opals
Keywords
SINGLE-PHASE
;
SINK ARRAY
;
ELECTRONICS
;
PERFORMANCE
;
FLUIDS
ISSN
0196-8904
Abstract
The utilization of a hierarchical microstructure and three-dimensional (3D) manifold for liquid delivery and liquid/vapor extraction could potentially improve the single-phase/two-phase thermal performance of microcoolers for high-heat-flux microelectronics applications exceeding 1 kW cm−2. In this work, we utilize a conformal coating of 8-μm-thick copper inverse opal (CuIO) films with ∼ 5-μm pore size on silicon microchannels in combination with a polydimethylsiloxane 3D manifold to remove heat fluxes up to 1147 W cm−2 under a water inlet temperature and flow rate of 20 °C and 200 g min−1, respectively. We achieved a convective thermal resistance of 0.068 cm2 K W−1 and total pressure drop of 32 kPa. Moreover, owing to copper micropores, a better hot-spot temperature uniformity (<6 K) with the aid of improved boiling nucleation was achieved. The interchip microchannel with a functional porous material and 3D manifold offers a disruptive thermal-management solution for high-performance electronic devices such as data centers, defense weapons, and power electronics for electric vehicles. © 2024 Elsevier Ltd
URI
http://hdl.handle.net/20.500.11750/57289
DOI
10.1016/j.enconman.2024.118809
Publisher
Elsevier
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Kwon, Hyuk-Jun
권혁준
Department of Electrical Engineering and Computer Science
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