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Department of Electrical Engineering and Computer Science
Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab.
1. Journal Articles
Combustion-assisted low-temperature ZrO2/SnO2 films for high-performance flexible thin film transistors
Jang, Bongho
;
Kim, Junil
;
Lee, Jieun
;
Park, Geuntae
;
Yang, Gyuwon
;
Jang, Jaewon
;
Kwon, Hyuk-Jun
Department of Electrical Engineering and Computer Science
Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab.
1. Journal Articles
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Title
Combustion-assisted low-temperature ZrO2/SnO2 films for high-performance flexible thin film transistors
Issued Date
2024-11
Citation
Jang, Bongho. (2024-11). Combustion-assisted low-temperature ZrO2/SnO2 films for high-performance flexible thin film transistors. npj Flexible Electronics, 8(1). doi: 10.1038/s41528-024-00362-8
Type
Article
Keywords
LEAKAGE CURRENT
;
LAYER
;
FACILE
;
GROWTH
;
STRESS
;
K GATE DIELECTRICS
Abstract
We developed high-performance flexible oxide thin-film transistors (TFTs) using SnO2 semiconductor and high-k ZrO2 dielectric, both formed through combustion-assisted sol-gel processes. This method involves the exothermic reaction of fuels and oxidizers to produce high-quality oxide films without extensive external heating. The combustion ZrO2 films were revealed to have an amorphous structure with a higher proportion of oxygen corresponding to the oxide network, which contributes to the low leakage current and frequency-independent dielectric properties. The ZrO2/SnO2 TFTs fabricated on flexible substrates using combustion synthesis exhibited excellent electrical characteristics, including a field-effect mobility of 26.16 cm2/Vs, a subthreshold swing of 0.125 V/dec, and an on/off current ratio of 1.13 × 106 at a low operating voltage of 3 V. Furthermore, we demonstrated flexible ZrO2/SnO2 TFTs with robust mechanical stability, capable of withstanding 5000 cycles of bending tests at a bending radius of 2.5 mm, achieved by scaling down the device dimensions. © The Author(s) 2024.
URI
http://hdl.handle.net/20.500.11750/57291
DOI
10.1038/s41528-024-00362-8
Publisher
Nature Publishing Group
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Kwon, Hyuk-Jun
권혁준
Department of Electrical Engineering and Computer Science
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