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dc.contributor.author Kim, Yu Na -
dc.contributor.author Kang, Eun Bin -
dc.contributor.author Kang, Yu Jin -
dc.contributor.author Lee, Junghoon -
dc.contributor.author Hong, Seung Sae -
dc.contributor.author Kim, Sung-Dae -
dc.contributor.author Jeong, Diana -
dc.contributor.author Lee, Min Sun -
dc.contributor.author Park, Woon Ik -
dc.date.accessioned 2026-05-22T14:10:11Z -
dc.date.available 2026-05-22T14:10:11Z -
dc.date.created 2026-05-06 -
dc.date.issued 2026-04 -
dc.identifier.issn 2574-0970 -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/60360 -
dc.description.abstract Extreme pressure imprint lithography (EPIL) offers a simple route to impart microscale geometries without thermal or chemical preconditioning, yet its integration with block copolymer (BCP) self-assembly remains relatively unexplored. Here we report an EPIL-directed micro- and nanopatterning strategy that couples mold-driven microscale confinement with thickness-dependent self-assembly of sphere-forming PS-b-PDMS thin films. When a spin-cast BCP film is imprinted with a rigid Si mold, the imposed height contrast, from a few nanometers on compressed mesas to tens of nanometers inside trenches, governs whether no pattern, monolayer, or double-layer nanostructures appear after thermal annealing and RIE treatment. On ductile Al substrates, simultaneous metal deformation and pressure-driven BCP redistribution create hierarchical patterns, in which polymer accumulation on the raised microfeatures after imprint release leads to selective formation of SiO x nanostructures. This EPIL-directed self-assembly approach provides large-area and shape-versatile patterning enabled by mechanically imposed confinement across rigid and ductile substrates, suggesting a broadly applicable route for hierarchical pattern engineering across multiple length scales. -
dc.language English -
dc.publisher AMER CHEMICAL SOC -
dc.title Extreme-Pressure Imprint-Directed Micropatterning of Self-Assembled Nanostructures -
dc.type Article -
dc.identifier.doi 10.1021/acsanm.6c00269 -
dc.identifier.wosid 001732673400001 -
dc.identifier.scopusid 2-s2.0-105036439273 -
dc.identifier.bibliographicCitation ACS APPLIED NANO MATERIALS, v.9, no.15, pp.6819 - 6827 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordAuthor block copolymers -
dc.subject.keywordAuthor EPIL -
dc.subject.keywordAuthor nanopatterning -
dc.subject.keywordAuthor micropatterning -
dc.subject.keywordAuthor self-assembly -
dc.subject.keywordPlus BIT-PATTERNED MEDIA -
dc.subject.keywordPlus BLOCK-COPOLYMERS -
dc.subject.keywordPlus NANOIMPRINT LITHOGRAPHY -
dc.subject.keywordPlus MICROPHASE SEPARATION -
dc.subject.keywordPlus FILM THICKNESS -
dc.subject.keywordPlus DENSITY -
dc.citation.endPage 6827 -
dc.citation.number 15 -
dc.citation.startPage 6819 -
dc.citation.title ACS APPLIED NANO MATERIALS -
dc.citation.volume 9 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.type.docType Article; Early Access -
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