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Extreme-Pressure Imprint-Directed Micropatterning of Self-Assembled Nanostructures
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Yu Na | - |
| dc.contributor.author | Kang, Eun Bin | - |
| dc.contributor.author | Kang, Yu Jin | - |
| dc.contributor.author | Lee, Junghoon | - |
| dc.contributor.author | Hong, Seung Sae | - |
| dc.contributor.author | Kim, Sung-Dae | - |
| dc.contributor.author | Jeong, Diana | - |
| dc.contributor.author | Lee, Min Sun | - |
| dc.contributor.author | Park, Woon Ik | - |
| dc.date.accessioned | 2026-05-22T14:10:11Z | - |
| dc.date.available | 2026-05-22T14:10:11Z | - |
| dc.date.created | 2026-05-06 | - |
| dc.date.issued | 2026-04 | - |
| dc.identifier.issn | 2574-0970 | - |
| dc.identifier.uri | https://scholar.dgist.ac.kr/handle/20.500.11750/60360 | - |
| dc.description.abstract | Extreme pressure imprint lithography (EPIL) offers a simple route to impart microscale geometries without thermal or chemical preconditioning, yet its integration with block copolymer (BCP) self-assembly remains relatively unexplored. Here we report an EPIL-directed micro- and nanopatterning strategy that couples mold-driven microscale confinement with thickness-dependent self-assembly of sphere-forming PS-b-PDMS thin films. When a spin-cast BCP film is imprinted with a rigid Si mold, the imposed height contrast, from a few nanometers on compressed mesas to tens of nanometers inside trenches, governs whether no pattern, monolayer, or double-layer nanostructures appear after thermal annealing and RIE treatment. On ductile Al substrates, simultaneous metal deformation and pressure-driven BCP redistribution create hierarchical patterns, in which polymer accumulation on the raised microfeatures after imprint release leads to selective formation of SiO x nanostructures. This EPIL-directed self-assembly approach provides large-area and shape-versatile patterning enabled by mechanically imposed confinement across rigid and ductile substrates, suggesting a broadly applicable route for hierarchical pattern engineering across multiple length scales. | - |
| dc.language | English | - |
| dc.publisher | AMER CHEMICAL SOC | - |
| dc.title | Extreme-Pressure Imprint-Directed Micropatterning of Self-Assembled Nanostructures | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1021/acsanm.6c00269 | - |
| dc.identifier.wosid | 001732673400001 | - |
| dc.identifier.scopusid | 2-s2.0-105036439273 | - |
| dc.identifier.bibliographicCitation | ACS APPLIED NANO MATERIALS, v.9, no.15, pp.6819 - 6827 | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.subject.keywordAuthor | block copolymers | - |
| dc.subject.keywordAuthor | EPIL | - |
| dc.subject.keywordAuthor | nanopatterning | - |
| dc.subject.keywordAuthor | micropatterning | - |
| dc.subject.keywordAuthor | self-assembly | - |
| dc.subject.keywordPlus | BIT-PATTERNED MEDIA | - |
| dc.subject.keywordPlus | BLOCK-COPOLYMERS | - |
| dc.subject.keywordPlus | NANOIMPRINT LITHOGRAPHY | - |
| dc.subject.keywordPlus | MICROPHASE SEPARATION | - |
| dc.subject.keywordPlus | FILM THICKNESS | - |
| dc.subject.keywordPlus | DENSITY | - |
| dc.citation.endPage | 6827 | - |
| dc.citation.number | 15 | - |
| dc.citation.startPage | 6819 | - |
| dc.citation.title | ACS APPLIED NANO MATERIALS | - |
| dc.citation.volume | 9 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics; Materials Science | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology; Materials Science, Multidisciplinary | - |
| dc.type.docType | Article; Early Access | - |
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- Lee, Min Sun이민선
-
Department of Electrical Engineering and Computer Science
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