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dc.contributor.author Hong, Woongki -
dc.contributor.author Bissannagari, Murali -
dc.contributor.author Cho, Youngjae -
dc.contributor.author Jang, Jae Eun -
dc.contributor.author Kwon, Hyuk-Jun -
dc.contributor.author Kang, Hongki -
dc.date.accessioned 2026-07-30T19:40:12Z -
dc.date.available 2026-07-30T19:40:12Z -
dc.date.created 2026-06-26 -
dc.date.issued 2026-06 -
dc.identifier.issn 1944-8244 -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/60546 -
dc.description.abstract Nanoparticle (NP)-based physical unclonable functions (PUFs) have attracted attention as a digital fingerprint technology that alternates with microfabrication-based PUFs by utilizing natural randomness at the nanoscale. Mostly NP-based optical PUFs have been proposed due to the absence of nanomaterial fabrication method compatible with microelectronics, but the need for a bulky optical readout system makes it difficult to utilize them in microelectronics. In this work, we developed the NP-based capacitor PUF (CAP-PUF) technology that can be read electrically and integrated into microelectronics while utilizing the benefit of the natural physical randomness of NPs. We incorporated a high-k BaTiO3 NP inkjet printing micropatterning process for the fabrication of the NP-embedded CAP-PUF array. The inkjet-printing parameters have been optimized to maximize the natural randomness of the BaTiO3 NP micropatterns by increasing the intrinsic stochasticity, especially the fluid dynamics that occurring during the multilayer printing. The BaTiO3 NP-embedded CAP-PUF array shows high security performance, showing the inter-hamming distance of 0.52, uniformity of 0.44, entropy of 0.989, and intra-hamming distance up to 0.064. High-k NP inkjet-printing-based CAP-PUFs can provide highly unique digital fingerprints based on the intrinsic randomness in nanoscale for microelectronics. -
dc.language English -
dc.publisher AMER CHEMICAL SOC -
dc.title Inkjet-Printed BaTiO3 Nanoparticle-Embedded Capacitor Array for Physical Unclonable Function -
dc.type Article -
dc.identifier.doi 10.1021/acsami.6c05306 -
dc.identifier.wosid 001788298100001 -
dc.identifier.scopusid 2-s2.0-105042631312 -
dc.identifier.bibliographicCitation ACS APPLIED MATERIALS & INTERFACES, v.18, no.24, pp.34004 - 34012 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor physical unclonable function -
dc.subject.keywordAuthor security applications -
dc.subject.keywordAuthor inkjet printing -
dc.subject.keywordAuthor high-k nanoparticles -
dc.subject.keywordAuthor capacitorarray -
dc.subject.keywordPlus SECURITY -
dc.citation.endPage 34012 -
dc.citation.number 24 -
dc.citation.startPage 34004 -
dc.citation.title ACS APPLIED MATERIALS & INTERFACES -
dc.citation.volume 18 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.type.docType Article -
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Jang, Jae Eun장재은

Department of Electrical Engineering and Computer Science

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