Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jung, Seunghwa | - |
dc.contributor.author | Choi, Jihwan P. | - |
dc.date.accessioned | 2018-12-05T07:53:04Z | - |
dc.date.available | 2018-12-05T07:53:04Z | - |
dc.date.created | 2018-11-26 | - |
dc.date.issued | 2019-03 | - |
dc.identifier.issn | 0951-8320 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/9450 | - |
dc.description.abstract | Static random-access memory-based field-programmable gate arrays are increasingly being used for on-board processors in space missions. However, they are very susceptible to single event upsets that can generate on-board processor system malfunction or system failures in space radiation environments. This paper presents an on-board processor system adopting Triple Modular Redundancy with the concept of mitigation windows and external scrubber, and then suggests a mathematical model that predicts the on-board processor system failure rate by only using the information of system configuration resources. Our mathematical derivation can estimate on-board processor system reliability as a function of the single event upset rate, the number of mitigation windows, and on-board processor shield thickness. In addition, a guideline of the on-board processor system design is provided for achieving good single event upset mitigation capability and system reliability. © 2018 Elsevier Ltd | - |
dc.language | English | - |
dc.publisher | Elsevier BV | - |
dc.title | Predicting System Failure Rates of SRAM-based FPGA On-Board Processors in Space Radiation Environments | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.ress.2018.09.015 | - |
dc.identifier.scopusid | 2-s2.0-85057611786 | - |
dc.identifier.bibliographicCitation | Reliability Engineering and System Safety, v.183, pp.374 - 386 | - |
dc.description.isOpenAccess | FALSE | - |
dc.subject.keywordAuthor | FPGA | - |
dc.subject.keywordAuthor | On-board processor | - |
dc.subject.keywordAuthor | Reliability | - |
dc.subject.keywordAuthor | Single event upset | - |
dc.subject.keywordAuthor | SRAM | - |
dc.subject.keywordAuthor | System failure rate | - |
dc.subject.keywordPlus | SEU | - |
dc.subject.keywordPlus | DESIGN | - |
dc.subject.keywordPlus | SINGLE | - |
dc.citation.endPage | 386 | - |
dc.citation.startPage | 374 | - |
dc.citation.title | Reliability Engineering and System Safety | - |
dc.citation.volume | 183 | - |
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