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Showing results 1 to 6 of 6

Conference
30.1 A 40nm VLIW Edge Accelerator with 5MB of 0.256pJ/b RRAM and a Localization Solver for Bristle Robot Surveillance
  • Spetalnick, Samuel D. ; 
  • Lele, Ashwin Sanjay ; 
  • Crafton, Brian ; 
  • Chang, Muya ; 
  • Ryu, Sigang ; 
  • Yoon, Jong-Hyeok ; 
  • Hao, Zhijian ; 
  • Ansari, Azadeh ; 
  • Khwa, Win-San ; 
  • Chih, Yu-Der ; 
    • et al
  • 2024-02-21
  • Spetalnick, Samuel D. (2024-02-21). 30.1 A 40nm VLIW Edge Accelerator with 5MB of 0.256pJ/b RRAM and a Localization Solver for Bristle Robot Surveillance. International Solid-State Circuits Conference, 482–484. doi: 10.1109/ISSCC49657.2024.10454500
  • IEEE Solid-State Circuits Society
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Article
An Edge Accelerator With 5 MB of 0.256-pJ/bit Embedded RRAM and a Localization Solver for Bristle Robot Surveillance
  • Spetalnick, Samuel D. ; 
  • Lele, Ashwin Sanjay ; 
  • Crafton, Brian ; 
  • Chang, Muya ; 
  • Ryu, Sigang ; 
  • Yoon, Jong-Hyeok ; 
  • Hao, Zhijian ; 
  • Ansari, Azadeh ; 
  • Khwa, Win-San ; 
  • Chih, Yu-Der ; 
    • et al
  • 2025-01
  • Spetalnick, Samuel D. (2025-01). An Edge Accelerator With 5 MB of 0.256-pJ/bit Embedded RRAM and a Localization Solver for Bristle Robot Surveillance. IEEE Journal of Solid-State Circuits, 60(1), 35–48. doi: 10.1109/JSSC.2024.3457676
  • Institute of Electrical and Electronics Engineers
  • View : 113
  • Download : 0
Conference
Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory
  • Crafton, Brian ; 
  • Talley, Connor ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Raychowdhury, Arijit
  • 2022-05-30
  • Crafton, Brian. (2022-05-30). Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory. IEEE International Symposium on Circuits and Systems (ISCAS 2022), 70–74. doi: 10.1109/ISCAS48785.2022.9937307
  • IEEE Circuits and Systems Society
  • View : 156
  • Download : 0
Conference
CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation
  • Crafton, Brian ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Wu, Wei ; 
  • Tokunaga, Carlos ; 
  • De, Vivek ; 
  • Raychowdhury, Arijit
  • 2021-11-09
  • Crafton, Brian. (2021-11-09). CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation. IEEE Asian Solid-State Circuits Conference, 1–3. doi: 10.1109/A-SSCC53895.2021.9634742
  • IEEE Solid-State Circuits Society
  • View : 91
  • Download : 0
Conference
Improving compute in-memory ECC reliability with successive correction
  • Crafton, Brian ; 
  • Wan, Zishen ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Wu, Wei ; 
  • Tokunaga,Carlos ; 
  • De, Vivek ; 
  • Raychowdhury, Arijit
  • 2022-07-13
  • Crafton, Brian. (2022-07-13). Improving compute in-memory ECC reliability with successive correction. Design Automation Conference, 745–750. doi: 10.1145/3489517.3530526
  • Association for Computing Machinery
  • View : 150
  • Download : 0
Conference
Statistical Optimization of Compute In-Memory Performance under Device Variation
  • Crafton, Brian ; 
  • Spetalnick, Samuel ; 
  • Yoon, Jong-Hyeok ; 
  • Raychowdhury, Arijit
  • 2021-07-26
  • Crafton, Brian. (2021-07-26). Statistical Optimization of Compute In-Memory Performance under Device Variation. IEEE International Symposium on Low-Power Electronics and Design, 1–6. doi: 10.1109/ISLPED52811.2021.9502484
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 125
  • Download : 0
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