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Showing results 1 to 4 of 4

Issue Date	Title Author(s) Journal	View
2017	Evaluation of interfacial resistances for thermoelectric devices Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Ho Young Thermoelectric Society of Japan, 2017	652
2018-12	Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Hoyoung Elsevier B.V., 2018-12	770
2016	Reversible carrier-type transition in Sn-Se thermoelectric materials Kim, Dong Hwan ; An, Ji Hyeon ; Kim, Jong Tae ; Baek, Ju Young ; Kim, Cham ; Kim, Ho Young Thermoelectric Society of Japan, 2016	590
2016	The interfacial resistances of thermoelectric device from the I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Baek, Ju Young ; Kim, Ho Young Thermoelectric Society of Japan, 2016	638

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