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Issue Date	Title Author(s) Journal	View
2009-12-10	TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS Chae, Hochang ; Jin, Xiulin ; Lee, Seonghun ; Cho, Jeonghun International Conference on Advanced Software Engineering and Its Applications, pp.204 - 212, 2009-12-10	33
2007-07	Sensitivity map generation in electrical capacitance tomography using mixed normalization models Kim, Yong Song ; Lee, Seonghun ; Ijaz, Umer Zeeshan ; Kim, Kyung Youn ; Choi, Bong Yeol Measurement Science and Technology, v.18, no.7, pp.2092 - 2102, 2007-07	72
2008	Web based Management System of a Remote Mobile Device using Device Management Protocol Ryu, Hyun Ki ; Cho, Sung Rae ; Piao, Shiquan ; Son, Jong Wuk ; Jung, Woo Young International journal of computer science and network security, v.8, no.4, pp.242 - 249, 2008	73

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