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Issue Date Title Author(s) Journal View
2009-10-01

Kim, Cham Kim, Jong Tae Kim, Ki Soo Jeong, Seonju Kim, Ho Young Han, Yoon Soo

Electrochimica Acta, v.54, no.24, pp.5715 - 5720, 2009-10-01

572
2008-06

Dho, Seok Ju Kim, Cham Lee, Se Geun Lee, Sung Jun Kim, Hoyoung

Journal of Hazardous Materials, v.154, no.1-3, pp.118 - 127, 2008-06

573
2009-10-01

Kim, Cham Kim, Jong Tae Kim, Ki Soo Jeong, Seonju Kim, Ho Young Han, Yoon Soo

Electrochimica Acta, v.54, no.24, pp.5715 - 5720, 2009-10-01

668
2017-08

Impact of transient currents caused by alternating drain stress in oxide semiconductors

Lee, Hyeon-Jun Cho, Sung Haeng Abe, Katsumi Lee, Myoung-Jae Jung, Minkyung

Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08

660
1

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