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Issue Date	Title Author(s) Journal	View
2009-12-10	TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS Chae, Hochang ; Jin, Xiulin ; Lee, Seonghun ; Cho, Jeonghun International Conference on Advanced Software Engineering and Its Applications, pp.204 - 212, 2009-12-10	44
2023-10-11	An I/O Simulation Method for AUTOSAR-Based Operation Verification in an QEMU-Based Virtual ECU Yang, Anna ; Han, Woo Jin ; Kim, Hyeong Rae ; Kim, Jae Gon ; Kum, Daehyun ; Cho, Jeonghun International Conference on Information and Communication Technology Convergence, ICTC 2023, pp.271 - 276, 2023-10-11	40

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