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Issue Date Title Author(s) Journal View
2009-12-10
TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS

Chae, Hochang ;  Jin, Xiulin ;  Lee, Seonghun ;  Cho, Jeonghun

International Conference on Advanced Software Engineering and Its Applications, pp.204 - 212, 2009-12-10

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