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Issue Date	Title Author(s) Journal	View
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	404
2022-11	Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure Noh, Hee Yeon ; Lee, Woo‑Geun ; G. R., Haripriya ; Cha, Jung‑Hwa ; Kim, June-Seo ; Yun, Won Seok ; Lee, Myoung-Jae ; Lee, Hyeon-Jun Scientific Reports, v.12, no.1, 2022-11	173

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