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Issue Date	Title Author(s) Journal	View
2021-11-09	CIM-SECDED: A 40nm 64Kb Compute In-Memory RRAM Macro with ECC Enabling Reliable Operation Crafton, Brian ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Wu, Wei ; Tokunaga, Carlos ; De, Vivek ; Raychowdhury, Arijit IEEE Asian Solid-State Circuits Conference, pp.1 - 3, 2021-11-09	11
2021-07-26	Statistical Optimization of Compute In-Memory Performance under Device Variation Crafton, Brian ; Spetalnick, Samuel ; Yoon, Jong-Hyeok ; Raychowdhury, Arijit IEEE International Symposium on Low-Power Electronics and Design, pp.1 - 6, 2021-07-26	53
2021-04-29	A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation Yoon, Jong-Hyeok ; Chang, Muya ; Khwa, Win-San ; Chih, Yu-Der ; Chang, Meng-Fan ; Raychowdhury, Arijit IEEE Custom Integrated Circuits Conference (CICC 2021), pp.152 - 153, 2021-04-29	53

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