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Results 1-6 of 6 (Search time: 0.002 seconds).

Issue Date	Title Author(s) Journal	View
2016	High thermoelectric figure of merit in n-typeBi-Te alloys at low temperatures Kim, Dong Hwan ; Baek, Ju Young ; Hwang, In Ji ; Kim, Cham ; Yoon, Duck Ki ; Kim, Ho Young Thermoelectric Society of Japan, 2016	618
2016	Reversible carrier-type transition in Sn-Se thermoelectric materials Kim, Dong Hwan ; An, Ji Hyeon ; Kim, Jong Tae ; Baek, Ju Young ; Kim, Cham ; Kim, Ho Young Thermoelectric Society of Japan, 2016	585
2016	The interfacial resistances of thermoelectric device from the I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Baek, Ju Young ; Kim, Ho Young Thermoelectric Society of Japan, 2016	631
2017	Evaluation of interfacial resistances for thermoelectric devices Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Ho Young Thermoelectric Society of Japan, 2017	646
2017	Synthesis and thermoelectric properties of Bi and Sb co-doped Mg-Si thermoelectic materials Kim, Dong Hwan ; Jihyeon Lee ; Jihyeon Ahn ; Kwanho Park ; Kim, Cham ; Kim, Ho Young Thermoelectric Society of Japan, 2017	601
2018-12	Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement Kim, Dong Hwan ; Kim, Cham ; Kim, Jong Tae ; Yoon, Duck Ki ; Kim, Hoyoung Elsevier B.V., 2018-12	728

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