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Page Scanning Techniques for Efficient Hotness Tracking in Tiered Memory Systems
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Title
Page Scanning Techniques for Efficient Hotness Tracking in Tiered Memory Systems
Alternative Title
계층 메모리 시스템에서 효과적인 접근 빈도 측정을 위한 페이지 탐색 기법
DGIST Authors
Kim HeesooDaehoon KimDonghoon Shin
Advisor
김대훈
Co-Advisor(s)
Donghoon Shin
Issued Date
2024
Awarded Date
2024-02-01
Citation
Kim Heesoo. (2024). Page Scanning Techniques for Efficient Hotness Tracking in Tiered Memory Systems. doi: 10.22677/THESIS.200000723697
Type
Thesis
Description
Tiered Memory System;Page Table Monitor; Physical Memory Address; Page Table Walk
Table Of Contents
Abstract
List of Contents
I. Introduction
II. Background and Motivation
2.1. Tiered Memory System
2.2. Demand Paging and Page Fault
2.3. Performance Impact of Slow Memory
2.4. Effective Page Management Through Monitor
III. Related Work
3.1. NUMA Hint Fault
3.2. PEBS: Processor Event-Based Sampling
3.3. Page Table-Based
IV. Page Scan Acceleration by Dynamically Eliminating Page Table Walk
4.1. Challenges
4.1.1. Migration
4.1.2. De-allocation
4.1.3. Allocation
4.2. Main Architecture
4.2.1. Physical Memory Address List Initialization
4.2.2. Access Pattern Monitoring
4.2.3. Thresholds of Page Fault Tracking and Synchronization
4.2.4. Page Fault Tracking
4.2.5. Synchronize
V. Evaluation
5.1. Experimental Methodology
5.2. Performance with Monitoring
5.2.1. Monitoring Overhead
5.2.2. Page Fault Tracking Overhead
5.2.3. Application Performance
5.3. Threshold Optimization
5.3.1. Page Fault Threshold
5.3.2. Synchronization Threshold and Time Window
5.3.3. Number of Untracked Pages to Tolerate
5.4. Effect of LRU and LFU
5.5. Comparison with PEBS
5.6. Overhead of Physical Memory Address List
VI. Conclusion
References
요약문
URI
http://hdl.handle.net/20.500.11750/48097
http://dgist.dcollection.net/common/orgView/200000723697
DOI
10.22677/THESIS.200000723697
Degree
Master
Department
Department of Electrical Engineering and Computer Science
Publisher
DGIST
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