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Title
Three-Dimensional Silicon Electronic Systems Fabricated by Compressive Buckling Process
Issued Date
2018-05
Citation
Kim, Bong Hoon. (2018-05). Three-Dimensional Silicon Electronic Systems Fabricated by Compressive Buckling Process. ACS Nano, 12(5), 4164–4171. doi: 10.1021/acsnano.8b00180
Type
Article
Author Keywords
three-dimensional electronicsmechanical bucklingsilicon transistorsilicon diode
Keywords
SINGLE-CRYSTAL SILICON3DDEVICES
ISSN
1936-0851
Abstract
Recently developed approaches in deterministic assembly allow for controlled, geometric transformation of two-dimensional structures into complex, engineered three-dimensional layouts. Attractive features include applicability to wide ranging layout designs and dimensions along with the capacity to integrate planar thin film materials and device layouts. The work reported here establishes further capabilities for directly embedding high-performance electronic devices into the resultant 3D constructs based on silicon nanomembranes (Si NMs) as the active materials in custom devices or microscale components released from commercial wafer sources. Systematic experimental studies and theoretical analysis illustrate the key ideas through varied 3D architectures, from interconnected bridges and coils to extended chiral structures, each of which embed n-channel Si NM MOSFETs (nMOS), Si NM diodes, and p-channel silicon MOSFETs (pMOS). Examples in stretchable/deformable systems highlight additional features of these platforms. These strategies are immediately applicable to other wide-ranging classes of materials and device technologies that can be rendered in two-dimensional layouts, from systems for energy storage, to photovoltaics, optoelectronics, and others. © 2018 American Chemical Society.
URI
http://hdl.handle.net/20.500.11750/6586
DOI
10.1021/acsnano.8b00180
Publisher
American Chemical Society
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김봉훈
Kim, Bong Hoon김봉훈

Department of Robotics and Mechatronics Engineering

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