DGIST Scholar: Browsing Repository

DGIST Scholar

Jump to: All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z; 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 5 of 5

Issue Date	Title Author(s) Journal	View
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	402
2019-08	Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor Lee, Hyeon-Jun ; Abe, Katsumi ; Noh, Hee Yeon ; Kim, June-Seo ; Lee, Hyunki ; Lee, Myoung-Jae Scientific Reports, v.9, no.1, pp.11977, 2019-08	632
2018-12	Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States Lee, Hyeon-Jun ; Abe, Katsumi ; Cho, Sung Haeng ; Kim, June Seo ; Bang, Seokhwan ; Lee, Myoung Jae Institute of Electrical and Electronics Engineers Inc., 2018-12	439
2017-12	Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor Lee, Hyeon-Jun ; Abe, Katsumi ; Kim, June-Seo ; Lee, Myoung Jae Nature Publishing Group, 2017-12	596
2017-08	Impact of transient currents caused by alternating drain stress in oxide semiconductors Lee, Hyeon-Jun ; Cho, Sung Haeng ; Abe, Katsumi ; Lee, Myoung-Jae ; Jung, Minkyung Scientific Reports, v.7, no.1, pp.9782 - 9790, 2017-08	645

DGIST

DGIST Scholar was built with support from the OAK distribution project by the National Library of Korea.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Library Services Team, DGIST 333. Techno Jungang-daero, Hyeonpung-myeon, Dalseong-gun, Daegu, 42988, Republic of Korea.

RSS_1.0 RSS_2.0 ATOM_1.0