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Showing results 2 to 4 of 4

Issue Date	Title Author(s) Journal	View
2019-12	Degradation mechanism of vanadium oxide films when grown on Y-stabilized ZrO2 above 500 oC Choi, Songhee ; Oh, Junhyeob ; Lee, Ji-Hyun ; Jang, Jae Hyuck ; Lee, Shinbuhm Advanced Engineering Materials, v.21, no.12, pp.1900918, 2019-12	613
2023	Degradation Mechanism of Lithium-ion Battery during Low-Temperature Over-discharge Cycling Eunsae Kim DGIST, 2023	77
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	404

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