Showing results 1 to 4 of 4
- 2020-06
- Lee, Hyeon-Jun. (2020-06). A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits. IEEE Electron Device Letters, 41(6), 896–899. doi: 10.1109/led.2020.2986478
- Institute of Electrical and Electronics Engineers
- View : 547
- Download : 0
- 2023
- Eunsae Kim. (2023). Degradation Mechanism of Lithium-ion Battery during Low-Temperature Over-discharge Cycling. doi: 10.22677/THESIS.200000656909
- DGIST
- View : 135
- Download : 0
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Choi, Songhee
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Oh, Junhyeob
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Lee, Ji-Hyun
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Jang, Jae Hyuck
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Lee, Shinbuhm
- 2019-12
- Choi, Songhee. (2019-12). Degradation mechanism of vanadium oxide films when grown on Y-stabilized ZrO2 above 500 oC. Advanced Engineering Materials, 21(12), 1900918. doi: 10.1002/adem.201900918
- John Wiley & Sons Ltd.
- View : 737
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Nam, Sungho
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Woo, Sungho
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Seo, Jooyeok
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Kim, Wook Hyun
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Kim, Hwajeong
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McNeill, Christopher R.
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Shin, Tae Joo
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Bradley, Donal D. C.
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Kim, Youngkyoo
- 2015-07
- ACS Applied Materials & Interfaces, v.7, no.29, pp.15995 - 16002
- American Chemical Society
- View : 963
- Download : 0
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