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Showing results 1 to 4 of 4

  • 2020-06
  • Lee, Hyeon-Jun. (2020-06). A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits. IEEE Electron Device Letters, 41(6), 896–899. doi: 10.1109/led.2020.2986478
  • Institute of Electrical and Electronics Engineers
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  • Eunsae Kim
  • 2023
  • Eunsae Kim. (2023). Degradation Mechanism of Lithium-ion Battery during Low-Temperature Over-discharge Cycling. doi: 10.22677/THESIS.200000656909
  • DGIST
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  • Choi, Songhee ; 
  • Oh, Junhyeob ; 
  • Lee, Ji-Hyun ; 
  • Jang, Jae Hyuck ; 
  • Lee, Shinbuhm
  • 2019-12
  • Choi, Songhee. (2019-12). Degradation mechanism of vanadium oxide films when grown on Y-stabilized ZrO2 above 500 oC. Advanced Engineering Materials, 21(12), 1900918. doi: 10.1002/adem.201900918
  • John Wiley & Sons Ltd.
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  • Nam, Sungho ; 
  • Woo, Sungho ; 
  • Seo, Jooyeok ; 
  • Kim, Wook Hyun ; 
  • Kim, Hwajeong ; 
  • McNeill, Christopher R. ; 
  • Shin, Tae Joo ; 
  • Bradley, Donal D. C. ; 
  • Kim, Youngkyoo
  • 2015-07
  • ACS Applied Materials & Interfaces, v.7, no.29, pp.15995 - 16002
  • American Chemical Society
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