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- Lee, Hyeon-Jun ;
- Abe, Katsumi
- 2020-06
- Lee, Hyeon-Jun. (2020-06). A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits. IEEE Electron Device Letters, 41(6), 896–899. doi: 10.1109/led.2020.2986478
- Institute of Electrical and Electronics Engineers
- View : 568
- Download : 0
- Eunsae Kim
- 2023
- Eunsae Kim. (2023). Degradation Mechanism of Lithium-ion Battery during Low-Temperature Over-discharge Cycling. doi: 10.22677/THESIS.200000656909
- DGIST
- View : 150
- Download : 0
- ;
- Oh, Junhyeob ;
- Lee, Ji-Hyun ;
- Jang, Jae Hyuck ;
- Lee, Shinbuhm
- 2019-12
- Choi, Songhee. (2019-12). Degradation mechanism of vanadium oxide films when grown on Y-stabilized ZrO2 above 500 oC. Advanced Engineering Materials, 21(12), 1900918. doi: 10.1002/adem.201900918
- John Wiley & Sons Ltd.
- View : 775
- Download : 0
- Nam, Sungho ;
- Woo, Sungho ;
- Seo, Jooyeok ;
- ;
- Kim, Hwajeong ;
- McNeill, Christopher R. ;
- Shin, Tae Joo ;
- Bradley, Donal D. C. ;
- Kim, Youngkyoo
- 2015-07
- ACS Applied Materials & Interfaces, v.7, no.29, pp.15995 - 16002
- American Chemical Society
- View : 993
- Download : 0
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