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Results 1-6 of 6 (Search time: 0.003 seconds).

Issue Date	Title Author(s) Journal	View
2006	On-line directional algebraic reconstruction technique for electrical capacitance tomography Kim, Ji Hoon ; Kang, Byoung Chae ; Choi, Bong Yeol ; Lee, Seong Hun ; Kim, Kyung Youn 2006 5th IEEE Conference on Sensors, pp.923 - 926, 2006	529
2007-07	Sensitivity map generation in electrical capacitance tomography using mixed normalization models Kim, Yong Song ; Lee, Seonghun ; Ijaz, Umer Zeeshan ; Kim, Kyung Youn ; Choi, Bong Yeol Measurement Science and Technology, v.18, no.7, pp.2092 - 2102, 2007-07	662
2007-07	Sensitivity map generation in electrical capacitance tomography using mixed normalization models Kim, Yong Song ; Lee, Seonghun ; Ijaz, Umer Zeeshan ; Kim, Kyung Youn ; Choi, Bong Yeol Measurement Science and Technology, v.18, no.7, pp.2092 - 2102, 2007-07	72
2009	Test methods of the AUTOSAR application software components Park, Gwangmin ; Kum, Daehyun ; Lee, Seonghun ; Won, Woong-Jae ; Jung, Wooyoung ICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009, pp.2601 - 2606, 2009	518
2009-12-10	TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS Chae, Hochang ; Jin, Xiulin ; Lee, Seonghun ; Cho, Jeonghun International Conference on Advanced Software Engineering and Its Applications, pp.204 - 212, 2009-12-10	33
2008-05	자동차 기술과 IT 기술 융합 SW 표준화 동향 박미룡 ; 이성훈 ; 박경민 ; 한태만 한국통신학회, 2008-05	279

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