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Issue Date	Title Author(s) Journal	View
2020-06	A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits Lee, Hyeon-Jun ; Abe, Katsumi IEEE Electron Device Letters, v.41, no.6, pp.896 - 899, 2020-06	404
2021-05	Parasitic Current Induced by Gate Overlap in Thin-Film Transistors Lee, Hyeon-Jun ; Katsumi Abe ; Kim, June-Seo ; Yun, Won Seok ; Lee, Myoung-Jae MDPI Open Access Publishing, 2021-05	333

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