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Title
Extreme-Pressure Imprint-Directed Micropatterning of Self-Assembled Nanostructures
Issued Date
2026-04
Citation
ACS APPLIED NANO MATERIALS, v.9, no.15, pp.6819 - 6827
Type
Article
Author Keywords
block copolymersEPILnanopatterningmicropatterningself-assembly
Keywords
BIT-PATTERNED MEDIABLOCK-COPOLYMERSNANOIMPRINT LITHOGRAPHYMICROPHASE SEPARATIONFILM THICKNESSDENSITY
ISSN
2574-0970
Abstract

Extreme pressure imprint lithography (EPIL) offers a simple route to impart microscale geometries without thermal or chemical preconditioning, yet its integration with block copolymer (BCP) self-assembly remains relatively unexplored. Here we report an EPIL-directed micro- and nanopatterning strategy that couples mold-driven microscale confinement with thickness-dependent self-assembly of sphere-forming PS-b-PDMS thin films. When a spin-cast BCP film is imprinted with a rigid Si mold, the imposed height contrast, from a few nanometers on compressed mesas to tens of nanometers inside trenches, governs whether no pattern, monolayer, or double-layer nanostructures appear after thermal annealing and RIE treatment. On ductile Al substrates, simultaneous metal deformation and pressure-driven BCP redistribution create hierarchical patterns, in which polymer accumulation on the raised microfeatures after imprint release leads to selective formation of SiO x nanostructures. This EPIL-directed self-assembly approach provides large-area and shape-versatile patterning enabled by mechanically imposed confinement across rigid and ductile substrates, suggesting a broadly applicable route for hierarchical pattern engineering across multiple length scales.

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URI
https://scholar.dgist.ac.kr/handle/20.500.11750/60360
DOI
10.1021/acsanm.6c00269
Publisher
AMER CHEMICAL SOC
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이민선
Lee, Min Sun이민선

Department of Electrical Engineering and Computer Science

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