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Results 1661-1670 of 1939 (Search time: 0.008 seconds).

  • 2025-04-02
  • Design Automation and Test in Europe Conference, pp.1 - 2
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 274
  • Download : 0
  • Lee, Hayan
  • Kim, Jungwoo
  • Lee, Wookyung
  • Park, Juhyung
  • Jung, Sanghyuk
  • Han, Jinki
  • Kim, Bryan S.
  • Lee, Sungjin
  • Lee, Eunji
  • 2025-07-10
  • ACM Workshop on Hot Topics in Storage and File Systems (HotStorage 2025), pp.24 - 30
  • ACM SIGOPS (Special Interest Group on Operating Systems)
  • View : 34
  • Download : 0
  • Park, Daehee
  • Monu Surana
  • Pranav Desai
  • Ashish Mehta
  • Reuben MV John
  • Yoon, Kuk-Jin
  • 2025-10-23
  • IEEE/CVF International Conference on Computer Vision, pp.27839 - 27850
  • IEEE Computer Society
  • View : 33
  • Download : 0
  • Lee, Giwon
  • Jeong, Wooseong
  • Park, Daehee
  • Jeong, Jaewoo
  • Yoon, Kuk-Jin
  • 2025-10-23
  • IEEE/CVF International Conference on Computer Vision
  • IEEE Computer Society and the Computer Vision Foundation
  • View : 25
  • Download : 0
  • Kim, Donggeon
  • Kim, Seongjin
  • Kim, Gain
  • 2025-01-21
  • International Conference on Electronics, Information, and Communication, ICEIC 2025, pp.1 - 6
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 234
  • Download : 0
  • 2025-12
  • ACS Applied Electronic Materials, v.7, no.24, pp.11294 - 11304
  • American Chemical Society
  • View : 41
  • Download : 0
  • Hwang, Kyumin
  • Choi, Wonhyeok
  • Han, Kiljoon
  • Choi, Wonjoon
  • Choi, Minwoo
  • Na, Yongcheon
  • Park, Minwoo
  • Im, Sunghoon
  • 2026-01
  • IEEE Robotics and Automation Letters, v.11, no.1, pp.1002 - 1009
  • Institute of Electrical and Electronics Engineers
  • View : 41
  • Download : 0
  • 2026-03
  • Ultrasonics, v.159
  • Elsevier
  • View : 26
  • Download : 0
  • Jang, Seo Won
  • Moon, Soomin
  • Park, Jae Yoon
  • Lee, Tae Gyun
  • Lee, Kijoon
  • 2026-03
  • Optics Communications, v.601, pp.132737
  • Elsevier
  • View : 23
  • Download : 0

Hole Current Enhancement Using W1-x Cr x Se2 Alloy Interface for p-Type WSe2 FETs

  • 2025-12
  • ACS Applied Materials & Interfaces, v.17, no.50, pp.68695 - 68702
  • American Chemical Society
  • View : 39
  • Download : 36