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Issue Date Title Author(s) Journal View
2022-07-13
Improving compute in-memory ECC reliability with successive correction

Crafton, Brian ;  Wan, Zishen ;  Spetalnick, Samuel ;  Yoon, Jong-Hyeok ;  Wu, Wei ;  Tokunaga,Carlos ;  De, Vivek ;  Raychowdhury, Arijit

Design Automation Conference, pp.745 - 750, 2022-07-13

 11
2022-05-30
Characterization and Mitigation of IR-Drop in RRAM-based Compute In-Memory

Crafton, Brian ;  Talley, Connor ;  Spetalnick, Samuel ;  Yoon, Jong-Hyeok ;  Raychowdhury, Arijit

IEEE International Symposium on Circuits and Systems (ISCAS 2022), pp.70 - 74, 2022-05-30

 9
2021-07-26
Statistical Optimization of Compute In-Memory Performance under Device Variation

Crafton, Brian ;  Spetalnick, Samuel ;  Yoon, Jong-Hyeok ;  Raychowdhury, Arijit

IEEE International Symposium on Low-Power Electronics and Design, pp.1 - 6, 2021-07-26

 53
2021-04-29
A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Custom Integrated Circuits Conference (CICC 2021), pp.152 - 153, 2021-04-29

 53
2022-05
BitS-Net: Bit-Sparse Deep Neural Network for Energy-Efficient RRAM-Based Compute-In-Memory

Karimzadeh, Foroozan ;  Yoon, Jong-Hyeok ;  Raychowdhury, Arijit

IEEE Transactions on Circuits and Systems I: Regular Papers, v.69, no.5, pp.1952 - 1961, 2022-05

 199
2022-03
A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, v.57, no.3, pp.845 - 857, 2022-03

 164
2023-03-22
A GaN-Based Reconfigurable Series-Parallel Hybrid Converter Supporting 48/24/12V Input and 0.8-1.2V Output with 83.7/87.8/90.7% Peak Efficiency

Gong, Minxiang ;  Chen, Hua ;  Chang, Muya ;  Yoon, Jong-Hyeok ;  Zhang, Xin ;  Jain, Rinkle ;  Raychowdhury, Arijit

Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023, pp.912 - 918, 2023-03-22

 49
2022-01
A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection

Yoon, Jong-Hyeok ;  Chang, Muya ;  Khwa, Win-San ;  Chih, Yu-Der ;  Chang, Meng-Fan ;  Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, v.57, no.1, pp.68 - 79, 2022-01

 354
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