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A Hybrid Digital-Analog Compute-in-Memory Using Content-Addressable Memory With Flexible Multi-Bit Slicing
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- Title
- A Hybrid Digital-Analog Compute-in-Memory Using Content-Addressable Memory With Flexible Multi-Bit Slicing
- Issued Date
- 2026-05
- Citation
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.73, no.5, pp.3452 - 3465
- Type
- Article
- Author Keywords
- Computer architecture ; Common Information Model (computing) ; Accuracy ; In-memory computing ; Trees (botanical) ; Adders ; Energy efficiency ; Transistors ; Computational modeling ; Computational efficiency ; Compute-in-memory ; content-addressable memory ; deep learning hardware ; hybrid CIM ; multi-bit slicing
- Keywords
- SRAM MACRO ; PRECISION
- ISSN
- 1549-8328
- Abstract
-
Compute-in-memory (CIM) reduces data movement and enhances compute parallelism, making it suitable for AI applications. However, analog CIMs, yet energy-efficient, are vulnerable to PVT variations, while digital CIMs offer robustness but limited efficiency due to their bit-wise computation overhead. To address these challenges, we propose a hybrid CIM architecture that integrates content-addressable memory (CAM) and cluster-based CIM, named CAM-CIM, fabricated in 65nm CMOS technology. The proposed CAM-CIM flexibly slices multi-bit weights, assigning MSBs to CAM and LSBs to CIM, enabling dynamic accuracy-efficiency trade-offs across various bit precisions. A two-stage 8:3 compressor-based adder tree improves CAM efficiency and a reference voltage search algorithm ensures accurate CIM computation with low-bit ADCs. Our CAM-CIM supports 1-8b inputs/weights with reconfigurable compute modes, leveraging ternary-CAM based selective columns and cluster-wise CIM processing to produce multiple trade-off points even in the same bit precision. A prototype chip with a RISC-V controller and custom instructions is demonstrated that shows energy efficiencies of 32.4TOPS/W (8b/8b) and 76.0-354.9TOPS/W (4b/4b) with 0.66% accuracy loss, on average, across a wide range of DNN benchmarks including CNNs and vision transformers on CIFAR and ImageNet datasets.
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- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Related Researcher
- Yoon, Jong-Hyeok윤종혁
-
Department of Electrical Engineering and Computer Science
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