DGIST ScholarDepartment of Electrical Engineering and Computer ScienceIntelligent Integrated Circuits and Systems Lab

1. Journal Articles 1

- Year

Issue Date Title First-Author(s) Citation Views
2022
A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection

Yoon, Jong-Hyeok; Chang, Muya; Khwa, Win-San; Chih, Yu-Der; Chang, Meng-Fan; Raychowdhury, Arijit

IEEE Journal of Solid-State Circuits, 57(1), 68-79

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