1. Journal Articles12
Department of Electrical Engineering and Computer Science
Intelligent Integrated Circuits and Systems Lab
Related Keyword
Showing results 1 to 12 of 12
- Jung, Sangwoo ;
- Lee, Hojin ;
- Park, Jiyong ;
- Lee, Yejin ;
- Park, Dahoon ;
- Shin, Hyunseob ;
- Yoon, Jong-Hyeok ;
- Kung, Jaeha
- 2026-05
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.73, no.5, pp.3452 - 3465
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- View : 77
- Download : 0
- ;
- Yoon, Dongjo ;
- ;
- ;
- ;
- Yoon, Jong-Hyeok ;
- Kwon, Hyuk-Jun ;
- Chung, Seungjun ;
- Nam, Yoonkey ;
- Kang, Hongki
- 2026-02
- Advanced Functional Materials, v.36, no.17
- Wiley
- View : 112
- Download : 0
Article
Translational reprogramming of dentate gyrus peptidergic circuitry gates antidepressant efficacy
- ;
- ;
- Roussarie, Jean-Pierre ;
- ;
- ;
- ;
- ;
- ;
- Lee, Kwang ;
- Yoon, Jong-Hyeok ; et al
- 2026-02
- Molecular Psychiatry
- Nature Publishing Group
- View : 166
- Download : 80
- 2026-01
- International Journal of Circuit Theory and Applications, v.54, no.1, pp.507 - 516
- Wiley
- View : 408
- Download : 0
- ;
- ;
- ;
- ;
- ;
- ;
- ;
- ;
- ;
- ; et al
- 2025-04
- npj Flexible Electronics, v.9, no.1
- Nature Publishing Group
- View : 705
- Download : 6
- ;
- ;
- Kim, Gain ;
- Song, Minyoung ;
- Yoon, Jong-Hyeok
- 2025-03
- Lee, Jaehyun. (2025-03). BEE-SLAM: A 65-nm 17.96-TOPS/W Location-Sharing-Based Multi-Agent Neuromorphic SLAM Accelerator for Swarm Robotics. IEEE Journal of Solid-State Circuits, 60(3), 963–976. doi: 10.1109/JSSC.2024.3505960
- Institute of Electrical and Electronics Engineers
- View : 321
- Download : 0
- ;
- ;
- ;
- ;
- Yoon, Jong-Hyeok ;
- Braendli, Matthias ;
- Morf, Thomas ;
- Kossel, Marcel ;
- Francese, Pier-Andrea ;
- Kim, Gain
- 2024-12
- IEEE Transactions on Circuits and Systems II: Express Briefs, v.71, no.12, pp.4889 - 4893
- Institute of Electrical and Electronics Engineers Inc.
- View : 232
- Download : 0
- Spetalnick, Samuel D. ;
- Lele, Ashwin Sanjay ;
- Crafton, Brian ;
- Chang, Muya ;
- Ryu, Sigang ;
- Yoon, Jong-Hyeok ;
- Hao, Zhijian ;
- Ansari, Azadeh ;
- Khwa, Win-San ;
- Chih, Yu-Der ; et al
- 2025-01
- Spetalnick, Samuel D. (2025-01). An Edge Accelerator With 5 MB of 0.256-pJ/bit Embedded RRAM and a Localization Solver for Bristle Robot Surveillance. IEEE Journal of Solid-State Circuits, 60(1), 35–48. doi: 10.1109/JSSC.2024.3457676
- Institute of Electrical and Electronics Engineers
- View : 232
- Download : 0
- ;
- ;
- Park, Dahoon ;
- Lee, Youngjoo ;
- Yoon, Jong-Hyeok ;
- Kung, Jaeha
- 2024-12
- Jung, Sangwoo. (2024-12). A Dual-Precision and Low-Power CNN Inference Engine Using a Heterogeneous Processing-in-Memory Architecture. IEEE Transactions on Circuits and Systems I: Regular Papers, 71(12), 5546–5559. doi: 10.1109/TCSI.2024.3395842
- Institute of Electrical and Electronics Engineers
- View : 341
- Download : 0
- Yoon, Jong-Hyeok ;
- Chang, Muya ;
- Khwa, Win-San ;
- Chih, Yu-Der ;
- Chang, Meng-Fan ;
- Raychowdhury, Arijit
- 2022-03
- Yoon, Jong-Hyeok. (2022-03). A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding. IEEE Journal of Solid-State Circuits, 57(3), 845–857. doi: 10.1109/JSSC.2022.3141370
- Institute of Electrical and Electronics Engineers
- View : 507
- Download : 0
- Karimzadeh, Foroozan ;
- Yoon, Jong-Hyeok ;
- Raychowdhury, Arijit
- 2022-05
- Karimzadeh, Foroozan. (2022-05). BitS-Net: Bit-Sparse Deep Neural Network for Energy-Efficient RRAM-Based Compute-In-Memory. IEEE Transactions on Circuits and Systems I: Regular Papers, 69(5), 1952–1961. doi: 10.1109/TCSI.2022.3145687
- Institute of Electrical and Electronics Engineers
- View : 421
- Download : 0
- Yoon, Jong-Hyeok ;
- Chang, Muya ;
- Khwa, Win-San ;
- Chih, Yu-Der ;
- Chang, Meng-Fan ;
- Raychowdhury, Arijit
- 2022-01
- Yoon, Jong-Hyeok. (2022-01). A 40-nm, 64-Kb, 56.67 TOPS/W Voltage-Sensing Computing-In-Memory/Digital RRAM Macro Supporting Iterative Write With Verification and Online Read-Disturb Detection. IEEE Journal of Solid-State Circuits, 57(1), 68–79. doi: 10.1109/jssc.2021.3101209
- Institute of Electrical and Electronics Engineers
- View : 711
- Download : 0
1