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Issue Date Title Author(s) Journal View
2022-11

Noh, Hee Yeon Lee, Woo‑Geun G. R., Haripriya Cha, Jung‑Hwa Kim, June-Seo Yun, Won Seok Lee, Myoung-Jae Lee, Hyeon-Jun

Scientific Reports, v.12, no.1, 2022-11

210
2022-07

Eom, Yunji Kim, Keonmok Lee, Hyeon-Jun Torati, Sri Ramulu Kim, CheolGi

IEEE Magnetics Letters, v.13, 2022-07

218
2022-11

Yun, Won Seok Lee, Hyeon-Jun Kim, June-Seo Lee, Myoung-Jae Han, Sang Wook

Physical Chemistry Chemical Physics, v.24, no.46, pp.28250 - 28256, 2022-11

214
2018-12

Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States

Lee, Hyeon-Jun Abe, Katsumi Cho, Sung Haeng Kim, June Seo Bang, Seokhwan Lee, Myoung Jae

Institute of Electrical and Electronics Engineers Inc., 2018-12

461
2019-02 595
2021-01

Cho, Jaehun Kim, Kyoung-Whan Lee, Myoung-Jae Lee, Hyeon-Jun Kim, June-Seo

Journal of Physics: Condensed Matter, v.33, no.1, 2021-01

470
2020-11

Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes

Lee, Myoung-Jae Seo, David H. Kwon, Sung Min Kim, Dohun Kim, Youngwook Yun, Won Seok Cha, Jung-Hwa Song, Hyeon-Kyo Lee, Shinbuhm Jung, Minkyung et al

American Chemical Society, 2020-11

653
2018-09

Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

Lee, Myoung-Jae Park, Gyeong-Su Seo, David Hyungseok Kwon, Sung Min Lee, Hyeon-Jun Kim, June-Seo Jung, Minkyung You, Chun-Yeol Lee, Hyangsook Kim, Hee-Goo et al

ACS Applied Materials & Interfaces, v.10, no.35, pp.29757 - 29765, 2018-09

718
2018-08

Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode

Song, Min Ho Lee, HyunKi Seo, David Hyungseok Lee, Hyeon-Jun Kim, June-Seo Cho, Hui-Sup Lyu, Hong-Kun Seo, Sun Ae Lee, Myoung-Jae

Institute of Electrical and Electronics Engineers Inc., 2018-08

830
2018-06

Kim, June Seo Lee, Hyeon-Jun Hong, Jung Il You, Chun Yeol

Elsevier B.V., 2018-06

712
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